Technology

Technology

  1. NanoSeeX's unique high-order EM-wave analysis method, which is globally unique and has received recognition for its innovation.
  2. The ability to visualize changes in 3D complex structure in both the x and y directions, demonstrating NanoSeeX's strength in addressing 3D structural challenges.
  3. The patented fan-shaped focusing technology that differentiates NanoSeeX from competitors and offers superior z-direction resolution and SNR values.
  4. The application of AI and machine learning to speed up analysis and improve precision.
  5. The advanced capability to achieve excellent linearity (R2> 0.999), accuracy (< 1 nm) and precision (< 0.1 nm) for 3D complex structure.
  6. Achievements in measuring multilayer film thickness, providing highly accurate (< 0.07 nm) and precise (< 0.046 nm) interlayer information that surpasses traditional methods like TEM.