X-ray AI Solutions: Revolutionizing Metrology with NanoSeeX’s Cutting-Edge Technology
Introduction
NanoSeeX is at the forefront of metrology innovation, leveraging advanced X-ray technology and artificial intelligence to provide unparalleled solutions for measuring and analyzing nanoscale structures. Our proprietary technologies and algorithms are designed to meet the high precision and accuracy demands of modern semiconductor manufacturing, making NanoSeeX a leader in the field.
Innovative X-ray Metrology
NanoSeeX’s X-ray AI Solutions integrate a multivariable physical model fitting and analysis algorithm. This advanced system combines data from multiple measurement techniques, including transmission, reflection, diffraction, and scattering spectra. By utilizing a dedicated electromagnetic wave calculation engine (EM engine), NanoSeeX can extract high-order signals to determine individual COST Х values and the associated structure parameter variances (Δp1, Δp2,…, Δpn).
Algorithm and Analysis
The core of our technology lies in our unique algorithm, which begins with statistical methods to compute the optimal fitting range for structural parameters. Within this range, randomized parameter combinations and cross feedback interactions generate superior structural solutions. The iterative process ensures that the resultant COST and FITTING VARIANCE are minimized compared to initial values, delivering more accurate and reliable results.
Unmatched Performance Metrics
NanoSeeX’s solutions excel in key metrology parameters such as linearity, precision, and accuracy:
- Linearity: Achieving a performance exceeding R^2=0.99, NanoSeeX sets a new standard in measurement consistency.
- Precision: With precision levels at ~0.1 nm, our technology meets the stringent demands of semiconductor production lines.
- Accuracy: Delivering accuracy below 1 nm, NanoSeeX ensures highly reliable measurements critical for advanced manufacturing processes.
Real-World Applications and Validation
NanoSeeX’s technology is robust and versatile, capable of handling blind tests and significant process variations. Our 12-inch wafer DEMO system, the first of its kind, has undergone extensive testing, demonstrating our capability to meet industry requirements. Developed in-house, our algorithms have been stress-tested with thousands of data points, ensuring their reliability and effectiveness in diverse scenarios.
AI Integration
Our AI-driven approach accelerates analysis and enhances the precision of structural measurements. By utilizing machine learning techniques, NanoSeeX’s algorithms quickly adapt to production line needs, speeding up the analysis process by over tenfold. This integration of AI ensures that our solutions remain at the cutting edge of technological advancements.
Competitive Edge
NanoSeeX stands out in the competitive landscape by achieving unprecedented de-correlation of model-based parameters, a feat that surpasses the capabilities of major industry players in 2024. Our solutions have been rigorously benchmarked against leading competitors, demonstrating superior performance in all key metrics.
Global Recognition and Collaborations
NanoSeeX’s innovations have been recognized globally, including winning the prestigious 2024 R&D 100, TREE Entrepreneurship Competition First Prize for our X-ray metrology technology. We are also actively seeking collaborations with leading research institutions and industry partners to further enhance our technological offerings and expand our market reach.
Conclusion
NanoSeeX’s X-ray AI Solutions represent a significant advancement in the field of metrology, providing unmatched precision, accuracy, and robustness. Our innovative technologies and algorithms position us at the forefront of the industry, ready to meet the evolving needs of our customers and drive future developments in X-ray metrology. With a commitment to excellence and continuous improvement, NanoSeeX is poised to lead the next generation of metrology solutions.
Call to Action
We invite potential partners and customers to engage with us and explore how NanoSeeX’s X-ray AI Solutions can meet your specific production needs. Contact us to learn more about our technology and how we can collaborate to achieve new heights in metrology excellence.